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AMP Inc.'s 2.5" PATA interface solid-state drive adopts advanced SSD controller and NAND Flash chip. It is compatible with ATA-7 protocol and supports PIO-4, MWDMA-2 and UDMA-6 transfer rate. The SSD supports mainstream OS, such as Windows/ MAC/ Linux/ Unix/ Solaris/ Vxworks, provides the storage capacity for customer ranging from 8GB to 128GB and is widely used in the reinforcement computer, industrial control computer, embedded computer and national defense fields.
AMP Inc.'s 2.5" PATA interface solid-state drives carry out a series of strict temperature, vibration and shock tests in accordance with the standards of military equipment to make sure the products can work in harsh environment.
S = SLC C = Commercial Temperature I = Industrial Temperature | |
Typical Applications:
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- Advance Wear-Leveling Algorithm
The NAND flash devices are limited by a certain number of write cycles. When using a file system, frequent file table updates is mandatory. If some area on the flash wears out faster than others, it would significantly reduce the lifetime of the whole device, even if the erase counts of others are far from the write cycle limit. Thus, if the write cycles can be distributed evenly across the media, the lifetime of the media can be prolonged significantly. The scheme is achieved both via buffer management and specific advanced wear leveling to ensure that the lifetime of the flash media can be increased, and the disk access performance is optimized as well.
- S.M.A.R.T Function
S.M.A.R.T. is an acronym for Self-Monitoring, Analysis and Reporting Technology, an open standard allowing disk drives to automatically monitor their own health and report potential problems. It protects the user from unscheduled downtime by monitoring and storing critical drive performance and calibration parameters. Ideally, this should allow taking proactive actions to prevent impending drive failure. SMART feature adopts the standard SMART command B0h to read data from the drive. When the SMART Utility running on the host, it analyzes and reports the disk status to the host before the device is in critical condition.
- Built-in Hardware ECC
The ATA-Disk Module uses BCH Error Detection Code (EDC) and Error Correction Code (ECC) algorithms which correct up to eight random single-bit errors for each 512-byte block of data. High performance is fulfilled through hardware-based error detection and correction.
Specifications:
| Physical Specifications | Interface | 44-pin IDE |
| Dimension | 100.20mm x 69.85mm x 9.3mm | |
| Capacity | 8GB˜256GB | |
| Flash Media | MLC-NAND Flash 8GB˜256GB SLC-NAND Flash 8GB˜128GB | |
| Sequential Read | Up to 80 MB/s | |
| Sequential Write | Up to 40 MB/s | |
| Performance | 4KB Random Read | Up to 3800 IOPS |
| 4KB Random Write | Up to 375 IOPS | |
| Reliability | Wrtie endurance: 8 years@ 100G write/day(32G) Read endurance: unlimited MTBF: >2,000,000 hours Date retention: >20years@ 25°C Date destroy do not support Sudden power-off recovery support ECC: 8bits for 512Bytes S.M.A.R.T and dynamic power management support Bad block management algorithm | |
| Environment | Storage temperature: -55˜95°C Operation temperature: Optional Humidity: 5%˜95% Vibration: 20G Peak, 10~2000Hz, (15mins/ Axis) x3 Axis Shock: 1500G (@0.5ms half sine wave) | |
| Electrical Specifications | Input Voltage | 5V ± 5% |
| Read Current | Read = 1.6 W (Max) | |
| Write Current | Write = 2.4 W (Max) | |
| Idle Current | Idle = 1.2 W | |
| Host Interface | Compliant with ATA-7 specification | |
| Supports PIO Mode 0-4 | ||
| Supports Multi-Word DMA Mode 0-2 | ||
| Supports Ultra DMA Mode 0-6 | ||
| Operating Temperature | Commercial Grade ( 0°C+70°) Industrial Grade ( -40°C+85°) | |
| Weight | < 120g | |
Performance, power consumption and weight vary with different capacity of products.
1317 E. Edinger Avenue, Santa Ana, CA 92705, USA | 714.460.9800 | sales@ampinc.biz | © 2012 All Rights Reserved
Quality Management Systems ISO 9001 - 2008
Environment Managed ISO 14001 - 2004
Quality Management Systems ISO 9001 - 2008Environment Managed ISO 14001 - 2004